Observe particles by using Scanning Electron Microscope (SEM), Energy Essay - 1

Observe particles by using S cigaretning electron Microscope (SEM), Energy Dispersive roentgen ray SEM and Transmission Electron Microscopy - Essay Examplem. SEM-EDAX analysis shows that the powder particles be those of ytterbium oxide and TEM analysis shows sound structure of fine TiO2 and Fe2O3. Results and analysis of these experiments are presented in this report. Introduction Electron microscopy has been a leap jump everyplace optical microscopy in the field of micro imaging. While resolution in case of optical microscopy is circumscribed by the wavelength of light, the same gets tremendously improved because accelerated electrons have more than smaller wavelengths and hence much better resolution in case of electron microscopy. Besides, micro imaging there are other benefits associated with using electron beam as canvass. This is because electron matter interaction produces a wide medley of signals like secondary electrons, pricker scattered electrons, fluorescence a nd singularity X-rays, transmission electrons, auger electrons etc. to name a few 1. These signals do not contain information rough only topography but also about chemistry of the region of interaction and hence micro-analytical information can also be extracted. This is the reason why a large image of micro-imaging and microanalytical instruments have been developed using electron beam as test and these are being widely utilise in the industry as well as in the advanced research. A brief introduction of some of these instruments like Scanning Electron Microscope (SEM), Scanning Electron Microscope with Energy Dispersive Analysis of X-rays (SEM-EDAX) and Transmission Electron Microscope (TEM) is presented in the following sections. Scanning Electron Microscope (SEM) 3 This microscope scans the probe electron beam over a raster and response signals like secondary and backscattered electrons are collected and used for image formation 2. It consists of a column always under vacuum consisting of different subcomponents. It consists of an electron flatulence or electron source. This is followed by condenser lenses to focus the beam. There are apertures in the path to render only the useful (central) portion of the beam to the subsequent stages. The focused beam is double scanned and made to sally through an aperture to fall onto the specimen. The beam is scanned over the specimen in a raster and the generated signals secondary or back scattered electrons are collected, amplified and again scanned in a raster onto a CRT screen in synchronised manner. Thus image is formed pixel by pixel. The magnification is ratio of the CRT screen sizing to the area of the raster onto the specimen. Because, the CRT size is fixed, therefore, magnification can be increased by scanning dismantle area onto the specimen and vice versa. While secondary electron provides topographic contrast, the backscattered electrons provide atomic number or Z-contrast. SEM with Energy Dispe rsive Analysis of X-rays (SEM-EDAX) EDAX is essentially a detector or an attachment to an instrument. This is exposed of detecting energy of the X-rays falling onto it. This uses a semiconductor SiLi or GeLi and as X-rays fall onto this semiconductor electrons are produced in the proportion of the energy of the X-rays and this produces a current which is used to determine energy of the X-ray. This attachment can be attached to different instruments like SEM, EPMA or Electron Probe Microanalyser or even with a TEM or Transmission Electron Microscope. When probe electron beam falls onto a sample characteristic X-rays are produced, which are collected and analyzed